Explores electron microscopy in situ, covering time-resolved techniques and environmental TEM applications for SOFC.
Explores imaging modes in TEM, covering electron-matter interactions, diffraction patterns, image formation, contrast principles, and detector configurations.
Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Explains Bragg's law in Transmission Electron Microscopy, focusing on the relationship between wavelength, crystal lattice spacing, and diffraction angle.
Covers STEM and EDX principles, X-ray generation, quantification methods, and analytical TEM applications.
