Built-in self-testUn built-in self-test, souvent appelé par l'acronyme BIST, est un mécanisme permettant à un système matériel , ou comprenant les deux, de se diagnostiquer lui-même. Le diagnostic peut être déclenché soit par l'utilisateur soit automatiquement. Si le diagnostic se fait automatiquement, il peut se faire à intervalle régulier, par déclenchement d'un circuit d'autosurveillance ou encore en continu. On trouve souvent ce mécanisme dans les circuits intégrés, car il permet une automatisation de la vérification du circuit.
Active-pixel sensorAn active-pixel sensor (APS) is an , which was invented by Peter J.W. Noble in 1968, where each pixel sensor unit cell has a photodetector (typically a pinned photodiode) and one or more active transistors. In a metal–oxide–semiconductor (MOS) active-pixel sensor, MOS field-effect transistors (MOSFETs) are used as amplifiers. There are different types of APS, including the early NMOS APS and the now much more common complementary MOS (CMOS) APS, also known as the CMOS sensor.
Standard cellIn semiconductor design, standard-cell methodology is a method of designing application-specific integrated circuits (ASICs) with mostly digital-logic features. Standard-cell methodology is an example of design abstraction, whereby a low-level very-large-scale integration (VLSI) layout is encapsulated into an abstract logic representation (such as a NAND gate). Cell-based methodology – the general class to which standard cells belong – makes it possible for one designer to focus on the high-level (logical function) aspect of digital design, while another designer focuses on the implementation (physical) aspect.
Multigate deviceA multigate device, multi-gate MOSFET or multi-gate field-effect transistor (MuGFET) refers to a metal–oxide–semiconductor field-effect transistor (MOSFET) that has more than one gate on a single transistor. The multiple gates may be controlled by a single gate electrode, wherein the multiple gate surfaces act electrically as a single gate, or by independent gate electrodes. A multigate device employing independent gate electrodes is sometimes called a multiple-independent-gate field-effect transistor (MIGFET).
Hard disk drive performance characteristicsHigher performance in hard disk drives comes from devices which have better performance characteristics. These performance characteristics can be grouped into two categories: access time and data transfer time (or rate). The access time or response time of a rotating drive is a measure of the time it takes before the drive can actually transfer data. The factors that control this time on a rotating drive are mostly related to the mechanical nature of the rotating disks and moving heads.
65 nmthumb|Processeur XCPU Falcon gravé en 65 nm désigne le procédé de fabrication des semi-conducteurs qui succède au procédé de fabrication par CMOS. Les premiers processeurs possédant cette technologie sont apparus sur le marché en 2006. Les processeurs Xenon de la génération "Falcon" sont gravés en technologie 65 nm, ainsi que les POWER6 et les Itanium 4 cores sortis en 2008. C'est également avec cette finesse qu'étaient gravés les CPU et GPU de certains modèles de PlayStation 3.
Power semiconductor deviceA power semiconductor device is a semiconductor device used as a switch or rectifier in power electronics (for example in a switch-mode power supply). Such a device is also called a power device or, when used in an integrated circuit, a power IC. A power semiconductor device is usually used in "commutation mode" (i.e., it is either on or off), and therefore has a design optimized for such usage; it should usually not be used in linear operation. Linear power circuits are widespread as voltage regulators, audio amplifiers, and radio frequency amplifiers.
Transistor countThe transistor count is the number of transistors in an electronic device (typically on a single substrate or "chip"). It is the most common measure of integrated circuit complexity (although the majority of transistors in modern microprocessors are contained in the cache memories, which consist mostly of the same memory cell circuits replicated many times). The rate at which MOS transistor counts have increased generally follows Moore's law, which observed that the transistor count doubles approximately every two years.
Ion Sensitive Field Effect TransistorL’ISFET, ou Ion Sensitive Field Effect Transistor, est un type de transistor à effet de champ dont la broche gate est sensible aux variations de concentration en ions. Sa principale utilisation est la mesure du pH. La broche gate est réalisée dans un matériau sensible à la concentration en ion hydrogène, ce qui fait varier la tension de seuil en conséquence. En pratique il s'agit de nitrure de silicium (SiN) ou d'oxyde d'aluminium (AlO) ou de tantale (TaO).
Microscope à effet tunnelthumb|Atomes de silicium à la surface d'un cristal de carbure de silicium (SiC). Image obtenue à l'aide d'un STM. Le microscope à effet tunnel (en anglais, scanning tunneling microscope, STM) est inventé en 1981 par des chercheurs d'IBM, Gerd Binnig et Heinrich Rohrer, qui reçurent le prix Nobel de physique pour cette invention en 1986. C'est un microscope en champ proche qui utilise un phénomène quantique, l'effet tunnel, pour déterminer la morphologie et la densité d'états électroniques de surfaces conductrices ou semi-conductrices avec une résolution spatiale pouvant être égale ou inférieure à la taille des atomes.
