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Lecture
Are you an EPFL student looking for a semester project?
Work with us on data science and visualisation projects, and deploy your project as an app on top of Graph Search.
This lecture covers the basics of Electron Backscatter Diffraction (EBSD) in Scanning Electron Microscopy (SEM), including orientation measurements, phase identification, and near-surface techniques. It explains how EBSD patterns are obtained, the importance of sample preparation, and the acquisition and indexation of EBSPs. The lecture also discusses the Hough transform for band detection, the influence of accelerating voltage, and the spatial and angular accuracy of EBSD. Furthermore, it explores the applications of EBSD in micro-crystallography, phase identification, and texture analysis, showcasing examples of directional solidification and phase identification in different materials.