Lecture

Semiconductor Devices II: Contact Resistance Modeling

Description

This lecture covers the modeling of contact resistance in semiconductor devices, including the calculation of gate voltage and channel charge from physical parameters. It discusses the transmission line method, Kirchoff's laws, and the transfer length concept. The lecture also delves into the practical methods of measuring contact resistance in 2D semiconductors and the importance of defects in the band structure. Various mathematical models and experimental data interpretation are presented.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_rkbi5l52

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Computer engineering

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Physics

Condensed matter physics: Solid-state physics

Electromagnetism: Electrical networks

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