Related lectures (9)
Design for Testability: Techniques and Hardware
Explores DFT techniques, scan design, JTAG boundary scan, and system test logic.
Design for Testability: Techniques and Methods
Explores Design for Testability techniques in VLSI systems, covering ad-hoc and structured methods, scan design, and modern testing standards.
VLSI Testing: Techniques and Economics
Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.
Test of VLSI Systems: Combinational and Sequential ATPG
Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.
Test of VLSI Systems: BIST and Response Compaction
Covers BIST techniques, LFSRs, Response Compaction, MISR, and BILBO in VLSI systems.
From Algorithms to Architectures
Explores the transition from algorithms to hardware architectures in digital system design, covering isomorphic architectures, VHDL implementation, and hardware efficiency metrics.
Response Compaction in VLSI Testing
Explores response compaction techniques in VLSI testing, including one's count compactor, transition count compactor, parity checking, LFSR, MISR, and BILBO.

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