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Related lectures (32)

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Electron Microscopy: Components and Operation

Explores the history and operation of electron microscopes, focusing on components and resolving power.

Electron Beam Lithography: Tool Overview

Explores Electron Beam Lithography (EBL), its tool overview, vacuum levels, electron sources, and guns for sub-20 nm feature fabrication.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Mass Spectrometry: Analyzing Peptides with Tandem MS

Covers mass spectrometry and tandem MS/MS techniques for peptide analysis, focusing on ionization, fragmentation, and sequence identification.

TEM Components and Operation

Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.

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Microfabrication Techniques: Inspection and Metrology

Explores microfabrication techniques for inspection and metrology in MEMS applications.

SEM Basics: Introduction to Electron Microscopy

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

FIB Applications: Nanofabrication and Failure Analysis

Explores Focused Ion Beam (FIB) applications in nanofabrication and failure analysis.

Sputtering: Ion Target Interactions

Examines ion-target interactions in PVD sputtering processes, covering compound deposition, surface damage, and factors influencing target ejection rates.