Scanning Probe Microscopy: Fundamentals and Applications

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Related lectures (32)

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Optical Microscopy: Concepts and Applications

Explores optical microscopy principles, techniques, resolution limits, and Nobel Prize-winning advancements in microscopy.

Scanning Probe Microscopy: AFM Basics

Covers the basics of scanning probe microscopy, with a focus on the Atomic Force Microscope (AFM) and its operational principles.

Scanning Probe Microscopy

Covers the principles and applications of Scanning Probe Microscopy, including working principles, different systems, and imaging applications.

Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Microscopy at Nanoscale: Techniques and Applications

Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.

Scanning Probe Microscopy

Explores the principles and applications of Scanning Probe Microscopy techniques.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Scanning Probe Microscopy: Advanced Modes

Explores advanced modes of AFM, high-speed imaging, MEM, SNOM, and a variety of SPM techniques.

Nanoscale MEMS: Fabrication, Tips, and Microscopy

Covers the fabrication of nanoscale MEMS devices and the operation of the Atomic Force Microscope for measuring ultrasmall forces on particles.

Atomic Resolution Techniques

Covers synchrotrons, x-ray lasers, and atomic resolution techniques like Cryo-EM and scanning tunneling microscopy.