Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
