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Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
Explores Environmental Scanning Electron Microscopy (ESEM) for imaging diverse samples without preparation, covering electron beam scanning, pressure manipulation, electron scattering, X-ray analysis, and phase transitions.
Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.
Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
Explores the principles and applications of scanning electron microscopy in micro and nanofabrication, covering electron signals, charging issues, and dimensional measurements.
Explores 3D Microscopy and Tomography techniques, including Atom Probe Tomography and Field Emission Microscopy, emphasizing electron tomography principles and applications.
Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.
