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Related lectures (32)

Page 3 of 4

Covers Energy Dispersive X-ray Microanalysis, exploring X-ray generation, detection, quantification, and challenges in accurate elemental analysis.

Dose Management in Electron Microscopy

Explores the challenges and solutions for managing electron dose in microscopy, emphasizing the importance of accurate dose tracking and analysis.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

Imaging modes in TEM

Explores imaging modes in TEM, covering electron-matter interactions, diffraction patterns, image formation, contrast principles, and detector configurations.

Film Thickness Determination: XPS Analysis

Explains film thickness determination using XPS and AES techniques, covering principles, instrumentation, and analytical comparisons.

Dynamical scattering: double diffraction

Delves into double diffraction in dynamical scattering, showcasing diffraction spots for forbidden planes and the Ewald sphere/reciprocal lattice.

Radiation-Matter Interaction: Electron Microscopy Introduction

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Transmission Electron Microscopy: basics

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Electron Microscopy: TEM

Introduces the principles of transmission electron microscopy (TEM) and its practical aspects.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.