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Lecture
STEM: Scanning Transmission Electron Microscopy
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Related lectures (32)
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Electron Microscope Components
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Scanning Electron Microscopy: Fundamentals and Applications
Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.
High Resolution He Ion Microscopy
Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.
Electron Microscopy: Instrumentation in Life Sciences
Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.
STEM & EDX: Electron Microscopy Principles
Covers electron microscopy principles, detectors, and contrast mechanisms.
Electron Diffraction: Basics & Applications
Explores electron diffraction fundamentals, crystal symmetry, and advanced techniques for materials analysis.
Microscopic Analyses & Electron Sources
Covers microscopic analyses using optical and electron microscopy, as well as electron sources.
Inelastic Scattering in Transmission Electron Microscopy
Introduces inelastic scattering in transmission electron microscopy, focusing on electron energy-loss spectroscopy principles and applications.
Electron Microscopy: TEM
Introduces the principles of transmission electron microscopy (TEM) and its practical aspects.
Introduction and Interaction with Radiation-Matter
Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.
