Explores the operation and analysis of a scanning electron microscope, covering SEM controls, detectors, image acquisition, spectra analysis, and software usage.
Explores beam-matter interactions, focusing on emission phenomena from core electron ionization by X-Rays and electrons, and the competition between Auger and X-Rays emissions.
Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.
Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.
Explores surface analysis methods using electrons, ions, atoms, and photons, emphasizing the importance of ToF-SIMS for in-depth surface analysis in various fields.
