Explores the operation and analysis of a scanning electron microscope, covering SEM controls, detectors, image acquisition, spectra analysis, and software usage.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
