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Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses

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Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses

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Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects

Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs

Mobility Degradation of 28-nm Bulk MOSFETs Irradiated to Ultrahigh Total Ionizing Doses

Charge-Based Modeling of Radiation Damage in Symmetric Double-Gate MOSFETs

Bias Dependence of Total Ionizing Dose Effects on 28-nm Bulk MOSFETs

Improvement of contact resistance in flexible a-IGZO thin-film transistors by CF4/O-2 plasma treatment

Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs

On current transients in MoS2 Field Effect Transistors

Modeling and optimization of Tunnel-FET architectures exploiting carrier gas dimensionality

Total ionizing dose effects on a 28 nm Hi-K metal-gate CMOS technology up to 1 Grad