Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Explores advanced SEM techniques and FIB technology for imaging and sample preparation.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.
