Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.
Covers the fundamental concepts of microscopy, explaining the need for magnification beyond the human eye and introducing advanced imaging techniques.
Introduces practical metrology experiments, covering topics like quantum metrology, single-photon experiments, and AFM for nanoscale measurements.
Covers the principles and applications of Scanning Probe Microscopy, including working principles, different systems, and imaging applications.
