Built-In Self-Test (BIST): Techniques and Implementations

Related lectures (32)

Page 1 of 4

Covers the structure theorem for state-space representations and companion forms.

Explores state-space representation, controllability, observability, and regulator calculation using the Ackermann method.

Covers fault simulation, testability analysis, and fault list generation in VLSI systems.

Covers the basics of state-space representation and explores transformations to different forms.

Explains irreducibility in polynomial equations and the properties of primitive polynomials.

Covers BIST techniques, LFSRs, Response Compaction, MISR, and BILBO in VLSI systems.

Covers controllability and observability in linear systems, discussing necessary conditions and implications of unimodular matrices.

Explores observability and controllability in linear systems, emphasizing the significance of input decoupling for observability.

Covers stability, poles, zeros, and control in dynamic systems, emphasizing the importance of observability.

Explores reachability and controllability in multivariable control systems, discussing tests, proofs, and their implications.