Focused Ion Beam: Principles and Applications

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Focused Ion Beam: Principles and Applications

Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.

Focused Ion Beam: Principles and Applications

Explores the principles and applications of Focused Ion Beam (FIB) technology, including ion-solid interactions, imaging, milling, and deposition.

Focused Ion Beam: Principles and Applications

Explores the principles and applications of Focused Ion Beam technology, including ion-solid interactions, ion milling, and nanofabrication.

Sputtering: Ion Target Interactions

Examines ion-target interactions in PVD sputtering processes, covering compound deposition, surface damage, and factors influencing target ejection rates.

FIB Applications: Nanofabrication and Failure Analysis

Explores Focused Ion Beam (FIB) applications in nanofabrication and failure analysis.

Plasma Focused Ion Beam: Applications and Techniques

Explores Plasma Focused Ion Beam technology, covering high-precision imaging, material deposition, and automated system checks.

Advanced SEM & FIB

Explores advanced SEM techniques and FIB technology for imaging and sample preparation.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Thin-Film Processing

Explores thin-film processing techniques, including CVD, ALD, and plasma interactions, emphasizing their advantages and applications.