Imaging Atoms and Fields at Picometer Scale

About
Privacy
Disclaimer

Graph Chatbot

Related lectures (32)

Page 1 of 4

Electron Microscopy Components

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Electron Microscopy: Components and Operation

Explores the history and operation of electron microscopes, focusing on components and resolving power.

TEM Components and Operation

Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.

Electron Microscopy: Basics and Techniques

Introduces the basics of electron microscopy, covering components, interactions, imaging modes, and nanofabrication techniques.

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Electron Microscope Components

Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.

Advanced SEM & FIB

Explores advanced SEM techniques and FIB technology for imaging and sample preparation.

Electron Microscopy: TEM

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

STEM: Scanning Transmission Electron Microscopy

Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.