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Lecture
Focused Ion Beam: Basics
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Focused Ion Beam: Principles and Applications
Explores the principles and applications of Focused Ion Beam technology, including ion-solid interactions, ion milling, and nanofabrication.
Focused Ion Beam: Principles and Applications
Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.
Focused Ion Beam: Principles and Applications
Explores the principles and applications of Focused Ion Beam (FIB) technology, including imaging, milling, and 3D microscopy.
Focused Ion Beam: Principles and Applications
Explores the principles and applications of Focused Ion Beam (FIB) technology, including ion-solid interactions, imaging, milling, and deposition.
Advanced SEM & FIB
Explores advanced SEM techniques and FIB technology for imaging and sample preparation.
AFM Tips and Cantilevers Fabrication
Explores the fabrication of AFM tips and cantilevers, including tip sharpening, thermal oxidation, and the use of carbon nanotubes as probes.
FIB Applications: Nanofabrication and Failure Analysis
Explores Focused Ion Beam (FIB) applications in nanofabrication and failure analysis.
Plasma Focused Ion Beam: Applications and Techniques
Explores Plasma Focused Ion Beam technology, covering high-precision imaging, material deposition, and automated system checks.
High Resolution He Ion Microscopy
Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.
Scanning Electron Microscopy: Fundamentals and Applications
Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.
