Focused Ion Beam: Basics

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Principle of SIMS

Explains the principle of Secondary Ion Mass Spectrometry (SIMS) and its applications.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Sputtering: Ion Target Interactions

Examines ion-target interactions in PVD sputtering processes, covering compound deposition, surface damage, and factors influencing target ejection rates.

Mass Spectrometry: Ion Sources and Analyzers

On Mass Spectrometry explores ionization principles, mass sorting techniques, and various mass analyzers.

SEM Basics: Imaging Parameters

Explores SEM basics, including imaging parameters, signal generation, and challenges.

Microfabrication Techniques: Inspection and Metrology

Explores microfabrication techniques for inspection and metrology in MEMS applications.

Microscopy Image Analysis

Explores light microscopy principles, fluorescent proteins, optical slicing, and modulation transfer functions in cellular imaging.

Introduction and Interaction with Radiation-Matter

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

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Mass Spectrometry: Analyzing Peptides with Tandem MS

Covers mass spectrometry and tandem MS/MS techniques for peptide analysis, focusing on ionization, fragmentation, and sequence identification.