An ion beam is a type of charged particle beam consisting of ions. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. A variety of ion beam sources exists, some derived from the mercury vapor thrusters developed by NASA in the 1960s. The most common ion beams are of singly-charged ions.
Ion current density is typically measured in mA/cm^2, and ion energy in eV. The use of eV is convenient for converting between voltage and energy, especially when dealing with singly-charged ion beams, as well as converting between energy and temperature (1 eV = 11600 K).
Most commercial applications use two popular types of ion source, gridded and gridless, which differ in current and power characteristics and the ability to control ion trajectories. In both cases electrons are needed to generate an ion beam. The most common electron emitters are hot filament and hollow cathode.
In a gridded ion source, DC or RF discharge are used to generate ions, which are then accelerated and decimated using grids and apertures. Here, the DC discharge current or the RF discharge power are used to control the beam current.
The ion current density that can be accelerated using a gridded ion source is limited by the space charge effect, which is described by Child's law:
where is the voltage between the grids, is the distance between the grids, and is the ion mass.
The grids are placed as closely as possible to increase the current density, typically . The ions used have a significant impact on the maximum ion beam current, since . Everything else being equal, the maximum ion beam current with krypton is only 69% the maximum ion current of an argon beam, and with xenon the ratio drops to 55%.
In a gridless ion source, ions are generated by a flow of electrons (no grids). The most common gridless ion source is the end-Hall ion source. Here, the discharge current and the gas flow are used to control the beam current.
One type of ion beam source is the duoplasmatron.
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.
Nanofabrication with focused charged particle beams (SEM, FIB) and their applications such as lithography, gas assisted deposition / etching, and milling are discussed and the limitations of these pro
Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micro
The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and
A particle accelerator is a machine that uses electromagnetic fields to propel charged particles to very high speeds and energies, and to contain them in well-defined beams. Large accelerators are used for fundamental research in particle physics. The largest accelerator currently active is the Large Hadron Collider (LHC) near Geneva, Switzerland, operated by the CERN. It is a collider accelerator, which can accelerate two beams of protons to an energy of 6.5 TeV and cause them to collide head-on, creating center-of-mass energies of 13 TeV.
An ion source is a device that creates atomic and molecular ions. Ion sources are used to form ions for mass spectrometers, optical emission spectrometers, particle accelerators, ion implanters and ion engines. Electron ionization Electron ionization is widely used in mass spectrometry, particularly for organic molecules. The gas phase reaction producing electron ionization is M{} + e^- -> M^{+\bullet}{} + 2e^- where M is the atom or molecule being ionized, e^- is the electron, and M^{+\bullet} is the resulting ion.
A particle beam is a stream of charged or neutral particles. In particle accelerators, these particles can move with a velocity close to the speed of light. There is a difference between the creation and control of charged particle beams and neutral particle beams, as only the first type can be manipulated to a sufficient extent by devices based on electromagnetism. The manipulation and diagnostics of charged particle beams at high kinetic energies using particle accelerators are main topics of accelerator physics.
The first MOOC to teach the basics of plasma physics and its main applications: fusion energy, astrophysical and space plasmas, societal and industrial applications
The first MOOC to teach the basics of plasma physics and its main applications: fusion energy, astrophysical and space plasmas, societal and industrial applications
Learn the basics of plasma, one of the fundamental states of matter, and the different types of models used to describe it, including fluid and kinetic.
A device for fragmenting ions by collision induced dissociation, the device intended to be used together with a planar ion mobility apparatus, the device including a first conductive grid having a plurality of first openings, the first conductive grid conf ...
2023
,
Electron beam-generated plasmas (EBPs) have been used to modify the surface properties. In certain applications, EBPs are transversely confined and their properties are of value to the treatment. In this paper, the characteristics of an electron beam-gener ...
IMPACT (Isotope and Muon Production with Advanced Cyclotron and Target Technologies) is a proposed initia- tive envisaged for the high-intensity proton accelerator fa- cility (HIPA) at the Paul Scherrer Institute (PSI). As part of IMPACT, a radioisotope ta ...