Metrology Practicals: Introduction

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Radiation-Matter Interaction: Electron Microscopy Introduction

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Introduction and Interaction with Radiation-Matter

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

Introduction to Metrology

Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.

Microscopy at Nanoscale: Techniques and Applications

Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Optical Microscopy: Concepts and Applications

Explores optical microscopy principles, techniques, resolution limits, and Nobel Prize-winning advancements in microscopy.

Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Microscopy: Imaging Systems and Techniques

Covers the fundamentals of microscopy, including lens functioning, image creation, and advanced techniques like fluorescence and super resolution.

Micro and Nanofabrication: Inspection and Metrology

Explores optical microscopy variations for inspection and dimension measurement in Micro and Nanofabrication processes.

Polymer Morphological Characterization Techniques: Introduction

Introduces polymer morphological characterization techniques, emphasizing the overlap between organic materials science and biosciences.