Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Explains the operation of the Atomic Force Microscope for imaging insulating surfaces and discusses the differences with the Magnetic Force Microscope.
