Electron Microscopy: Basics and Techniques

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Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Covers the basics of Scanning Electron Microscopy, including working principles, image generation, signal production, and challenges.

Covers the basics of Scanning Electron Microscopy, including setup, signals, and challenges like beam damage and charging.

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

Covers descriptive statistics, hypothesis testing, and correlation analysis with various probability distributions and robust statistics.