Inspection and Metrology: Electron Microscopy

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Related lectures (32)

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Analytical Electron Microscopy: Spectroscopy and Microanalysis

Explores Analytical Electron Microscopy techniques for chemical analysis using EELS and EDX.

Electron Microscopy: EDS and ESEM

Explores EDS and ESEM principles, x-ray detection, ionization efficiency, Moseley's law, and ESEM sample environments.

Inelastic Scattering in Transmission Electron Microscopy

Introduces inelastic scattering in transmission electron microscopy, focusing on electron energy-loss spectroscopy principles and applications.

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

X-rays: From Discovery to Applications

Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Electron Microscopy: Quantum Information Era

Explores electron microscopy in the quantum information era, focusing on sensing magnetic ordering and electric fields at atomic and nanometer levels.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

STEM: Scanning Transmission Electron Microscopy

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Analytical Electron Microscopy: Fine Structures and Instrumentation

Explores thickness measurements, scattering geometry, ELNES of anisotropic materials, and instrumentation in electron microscopy.