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Imina Technologies Sàrl

Description

Imina Technologies Sàrl specializes in providing high-precision robotic solutions for interacting with and characterizing samples at the nanometer scale under light and electron microscopes. Their innovative motion technology enables easy positioning of probes and stable electrical contacts, offering flexibility for deep integration with various microscopy and test equipment. Their solutions cater to a wide range of applications, including electrical probing, failure analysis, defect localization, manipulation of particles, and sample preparation for further investigations. Trusted by leading semiconductor companies and research institutes globally, Imina Technologies' modular robotic platforms are designed to enhance measurement workflows and make probing at micro and nano scales convenient.

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Description

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Categories (8)

Electron-beam technology

Since the mid-20th century, electron-beam technology has provided the basis for a variety of novel and specialized applications in semiconductor manufacturing, microelectromechanical systems, nanoelectromechanical systems, and microscopy. Free electrons in a vacuum can be manipulated by electric and magnetic fields to form a fine beam. Where the beam collides with solid-state matter, electrons are converted into heat or kinetic energy. This concentration of energy in a small volume of matter can be precisely controlled electronically, which brings many advantages.

Topics in nanotechnology

Nanotechnology, often shortened to nanotech, is the use of matter on atomic, molecular, and supramolecular scales for industrial purposes. The earliest, widespread description of nanotechnology referred to the particular technological goal of precisely manipulating atoms and molecules for fabrication of macroscale products, also now referred to as molecular nanotechnology. A more generalized description of nanotechnology was subsequently established by the National Nanotechnology Initiative, which defined nanotechnology as the manipulation of matter with at least one dimension sized from 1 to 100 nanometers (nm).

Manufacturing engineering

Manufacturing engineering or production engineering is a branch of professional engineering that shares many common concepts and ideas with other fields of engineering such as mechanical, chemical, electrical, and industrial engineering. Manufacturing engineering requires the ability to plan the practices of manufacturing; to research and to develop tools, processes, machines and equipment; and to integrate the facilities and systems for producing quality products with the optimum expenditure of capital.

Nanotechnology

Related concepts (23)

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Low-voltage electron microscope

Low-voltage electron microscope (LVEM) is an electron microscope which operates at accelerating voltages of a few kiloelectronvolts or less. Traditional electron microscopes use accelerating voltages in the range of 10-1000 keV. Low voltage imaging in transmitted electrons is possible in many new scanning electron detector. Low cost alternative is dedicated table top low voltage transmission electron microscope.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Related people (32)

Jürgen Brugger

I am a Professor of Microengineering and co-affiliated to Materials Science. Before joining EPFL I was at the MESA Research Institute of Nanotechnology at the University of Twente in the Netherlands, at the IBM Zurich Research Laboratory, and at the Hitachi Central Research Laboratory, in Tokyo, Japan. I received a Master in Physical-Electronics and a PhD degree from Neuchâtel University, Switzerland. Research in my laboratory focuses on various aspects of MEMS and Nanotechnology. My group contributes to the field at the fundamental level as well as in technological development, as demonstrated by the start-ups that spun off from the lab. In our research, key competences are in micro/nanofabrication, additive micro-manufacturing, new materials for MEMS, increasingly for wearable and biomedical applications. Together with my students and colleagues we published over 200 peer-refereed papers and I had the pleasure to supervise over 25 PhD students. Former students and postdocs have been successful in receiving awards and starting their own scientific careers. I am honoured for the appointment in 2016 as Fellow of the IEEE “For contributions to micro and nano manufacturing technology”. In 2017 my lab was awarded an ERC AdvG in the field of advanced micro-manufacturing.

Klaus Kern

Klaus Kern is Professor of Physics at EPFL and Director and Scientific Member at the Max-Planck-Institute for Solid State Research in Stuttgart, Germany. He also is Honorary Professor at the University of Konstanz, Germany. His present research interests are in nanoscale science, quantum technology and in microscopy at the atomic limits of space and time. He holds a chemistry degree and PhD from the University of Bonn and a honorary doctors degree from the University of Aalborg. After his doctoral studies he was staff scientist at the Research Center Jülich and visiting scientist at Bell Laboratories, Murray Hill before joining the Faculty of EPFL in 1991 and the Max-Planck-Society in 1998. Professor Kern has authored and coauthored close to 700 scientific publications, which have received nearly 60‘000 citations. He has served frequently on advisory committees to universities, professional societies and institutions and has received numerous scientific awards and honors, including the 2008 Gottfried-Wilhelm-Leibniz Prize and the 2016 Van‘t Hoff Prize. Prof. Kern has also educated a large number of leading scientists in nanoscale physics and chemistry. During the past twenty-five years he has supervised one hundred PhD students and sixty postdoctoral fellows. Today, more than fifty of his former students and postdocs hold prominent faculty positions at Universities around the world.

Related publications (30)

Electron-beam based nanoscale quantum controls

Hoda Shirzad

Advancing quantum technologies depends on the precise control of individual quantum systems, the so-called qubits, and the exploitation of their quantum properties. Nowadays, expanding the number of qubits to be entangled is at the core of the developments ...

EPFL2024

Microsecond Time-Resolved Cryo-Electron Microscopy

Oliver Florian Harder

Recently, single-particle cryo-electron microscopy emerged as a technique capable of determining protein structures at near-atomic resolution and resolving protein dynamics with a temporal resolution ranging from second to milliseconds. This thesis describ ...

EPFL2024

Structural study of nickelate based heterostructures

Duncan Thomas Lindsay Alexander, Chih-Ying Hsu, Bernat Mundet, Jean-Marc Triscone

Heterostructures consisting of SmNiO3 and NdNiO3 alternating layers with additional LaAlO3 spacer layers were grown and fully characterized by means of x-ray diffraction, atomic force microscopy, and scanning transmission electron microscopy. A change in t ...

Aip Publishing2024

Related units (31)