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Related lectures (32)

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Electron Microscopy Components

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Advanced SEM Technologies and Examples

Explores advanced SEM technologies, low voltage imaging, high-resolution SEM, and analytical capabilities with practical examples.

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Advanced SEM Technologies and Examples

Explores advanced SEM technologies, detectors, and specimen preparation for high-resolution imaging and analytical capabilities.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

SEM Basics: Introduction to Electron Microscopy

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

Improving Electron Microscope Capabilities: Cold Field Emission Source

Delves into designing a new cold field emission electron source for improved electron microscope capabilities.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

TEM Components and Operation

Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.

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