Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.
Explores advanced SEM techniques and FIB technology for imaging and sample preparation.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
